Немного устарело, но все же.
Abstract. This work presents a novel low-cost optoelectronic setup for
time- and spatially resolved analysis of photonic emissions and a cor-
responding methodology, Simple Photonic Emission Analysis (SPEA).
Observing the backside of ICs, the system captures extremly weak photo-
emissions from switching transistors and relates them to program run-
ning in the chip. SPEA utilizes both spatial and temporal information
about these emissions to perform side channel analysis of ICs. We suc-
cessfully performed SPEA of a proof-of-concept AES implementation and
were able to recover the full AES secret key by monitoring accesses to the
S-Box. This attack directly exploits the side channel leakage of a single
transistor and requires no additional data processing. The system costs
and the necessary time for an attack are comparable to power analysis
techniques. The presented approach significantly reduces the amount of
effort required to perform attacks based on photonic emission analysis
and allows AES key recovery in a relevant amount of time.